EL Chip Inspection Machine
EL Chip Inspection Machine is used for automatic sorting and inspection of LED chips after epitaxial production on sapphire substrate. The operation is to use intuitive telecommunication LED inspection to confirm the conductivity of the LED metal electrode pins, and to determine whether the LED is good or bad.
Function
- Brightness information (bright point, dark point)
- Bad point detection, memory coordinates
- Detection yield statistics, total defect number display.
- Bad point (AA area) can be presented in the form of a map freely defined by the product.
- Can identify whether the LED is lit or not in the AA area (hardware segmentation stage, products need to have auxiliary Mark for inspection)
(Depends on the product specifications and operational parameters).
- Definition of small size defect, middle size defect, large size defect, over size defect can be freely defined according to the product.
Benefits
Can check the LEDs in advance before the production process to avoid the loss of the subsequent process.
Added to your inquiry
CST_ELCheck
EL Chip Inspection Machine